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双折射(应力)测量系统

Exicor-150AT

Exicor-150AT

美国Hinds成立于1971年,凭借其专利的PEM(光弹变调制)技术研发了高稳定的应力双折射测量系统,是目前世界上最高精度,广泛用于玻璃、镜片、激光晶体等行业。同..
 

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Exicor-PV-Si-Product-Bulletin

Exicor-PV-Si-Product-Bulletin

During the production of Si solar panels, stress in Si crystals often remains undetected long into the fabrication process. We describe a stress biref..
 

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Exicor-GEN6

Exicor-GEN6

EXICORGEN6 LCD 凭借多年与世界顶级光学材料生产商们合作的经验,Hinds仪器公司推出了1500AT系统来测量例如LCD这样大面积的光学材料(达1500mm x 1500mm)。由于..
 

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Exicor-Systems-Product-Bulletin

Exicor-Systems-Product-Bulletin

Exicor® birefringence measurement technology, introduced in 1999 with the model 150AT, provides leading edge customers with the world’s most technic..
 

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